EIGER2 X/XE CdTe for Synchrotrons

With their high count and frame rates and coverage of a broad energy range, EIGER2 X/XE CdTe X-ray detectors are designed to advance high-energy research at synchrotron beamlines.

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DECTRIS EIGER2® X/XE CdTe photon-counting detectors provide high quantum efficiency for hard X-ray energies up to 100 keV, with a spatial resolution of 75 µm. Their cadmium-telluride sensor, which is 750 µm thick, brings all the advantages of EIGER2 X-ray detectors to high-energy applications. A high frame rate up to 2,000 kHz; under 100 ns of effective dead time between exposures; and ideal counting statistics enabled by a sharp, single-pixel point-spread function guarantee outstanding performance and accurate data collection. 

Furthermore, these beamline detectors offer two independent energy thresholds that will enable you to suppress fluorescence background (with the lower threshold) while measuring the contribution of higher harmonics (with the upper threshold).

EIGER2 X/XE CdTe detectors come in different geometries and performances, and with optional vacuum capability. DECTRIS’ dedicated Support and Commissioning team will help you minimize any downtime.

  • Fast: these detectors offer image frame rates up to 2 kHz, along with advanced gating/triggering capabilities.
  • More & better data: our detectors feature high quantum efficiency, two adjustable energy-discriminating thresholds, and a high count rate. There is no readout noise or dark current.
  • Reliable: these detectors feature extremely stable performance and radiation hard design. Delivery terms are guaranteed, thanks to streamlined industrial production and top-notch support over the product’s entire lifetime.

Detectors

EIGER2 XE CdTe 16M

EIGER2 XE CdTe 16M

Our top-of-the-line product, beeing the ultimate choice for high-energy applications at unlimited speed.

EIGER2 XE CdTe 9M

EIGER2 XE CdTe 9M

With a large active area and a continuous frame rate of up to 550 Hz, this is the perfect detector for high-throughput scanning, fast scanning or time-resolved measurements.

EIGER2 X CdTe 16M

EIGER2 X CdTe 16M

This detector offers the larges active area of our EIGER2 seies with a resolution of more than 4k x 4k pixels - the perfect system for highest-quality X-Ray diffraction in a single shot.

EIGER2 X CdTe 9M

EIGER2 X CdTe 9M

This detector combines a large active area, advanced external triggering, and gating capabilities. It is an excellent allrounder for synchrotron applications at high-energies.

EIGER2 X CdTe 4M

EIGER2 X CdTe 4M

This detector provides wide-angle coverage with a high resolution for compact experimental setups.

EIGER2 X CdTe 1M

EIGER2 X CdTe 1M

This detector offers excellent versatility for high-energy, in-situ X-ray research.

EIGER2 X CdTe 500K

EIGER2 X CdTe 500K

Light and compact, this detector can fit into any high-energy experimental setup.

EIGER2 X CdTe 2M-W

EIGER2 X CdTe 2M-W

Its wide geometry, combined with all the advantages of DECTRIS’ hybrid-pixel technology, make this detector the ideal X-ray detector for powder diffraction applications.

EIGER2 X CdTe 1M-W

EIGER2 X CdTe 1M-W

This detector provides a unique combination of a CdTe sensor, superior sensitivity to X-rays above 20 keV, a wide geometry, and an excellent frame rate of up to 2,000 Hz. It is ideal for high-energy X-ray diffraction applications.

Detector Specifications*

EIGER2 XE CdTe 16M EIGER2 XE CdTe 9M EIGER2 X CdTe 16M EIGER2 X CdTe 9M EIGER2 X CdTe 4M EIGER2 X CdTe 1M EIGER2 X CdTe 500K EIGER2 X CdTe 2M-W EIGER2 X CdTe 1M-W

Active area (W x H)

[

mm²

]

311.1 x 327.2

233.1 x 244.7

311.1 x 327.2

233.1 x 244.7

155.1 x 162.2

77.1 x 79.7

77.1 x 38.4

311.1 x 38.4

155.1 x 38.4

Pixel array (W x H)

4,148 x 4,362

3,108 x 3,262

4,148 x 4,362

3,108 x 3,262

2,068 x 2,162

1,028 x 1,062

1,028 x 512

4,148 x 512

2,068 x 512

Pixel size (W x H)

[

µm²

]

75 x 75

75 x 75

75 x 75

75 x 75

75 x 75

75 x 75

75 x 75

75 x 75

75 x 75

Inter-module gap (Hor./Vert.)

[

pixels

]

12 / 38

12 / 38

12 / 38

12 / 38

12 / 38

- / 38

- / -

12 / -

12 / -

Intra-module gap (Hor.)

[

pixels

]

2

2

2

2

2

2

2

2

2

Count rate (max.)

[

ph/s/pixel

]

107

107

107

107

107

107

107

107

107

Energy range

[

keV

]

8 - 100

8 - 100

8 - 100

8 - 100

8 - 100

8 - 100

8 - 100

8 - 100

8 - 100

Number of energy thresholds

2

2

2

2

2

2

2

2

2

Threshold range

[

keV

]

4 - 80

4 - 80

4 - 80

4 - 80

4 - 80

4 - 80

4 - 80

4 - 80

4 - 80

Frame rate (max.)

[

Hz

]

700 (8-bit);
560 (16-bit)

700 (8-bit);
560 (16-bit)

280 (8-bit);
140 (16-bit)

490 (8-bit);
245 (16-bit)

1,120 (8-bit);
560 (16-bit)

4,500 (8-bit);
2,250 (16-bit)

4,500 (8-bit);
2,250 (16-bit)

2,250 (8-bit);
1,125 (16-bit)

4,500 (8-bit);
2,250 (16-bit)

Region of Interest (ROI) readout

Yes

Yes

Yes

Yes

Not applicable

Not applicable

Not applicable

Not applicable

Not applicable

Readout time

Continuous readout

Continuous readout

Continuous readout

Continuous readout

Continuous readout

Continuous readout

Continuous readout

Continuous readout

Continuous readout

External gating

Yes

Yes

Yes

Yes

Yes

Yes

Yes

Yes

Yes

Image bit depth

[

bits

]

32

32

32

32

32

32

32

32

32

Sensor material

Cadmium telluride (CdTe)

Cadmium telluride (CdTe)

Cadmium telluride (CdTe)

Cadmium telluride (CdTe)

Cadmium telluride (CdTe)

Cadmium telluride (CdTe)

Cadmium telluride (CdTe)

Cadmium telluride (CdTe)

Cadmium telluride (CdTe)

Sensor thickness

[

µm

]

750

750

750

750

750

750

750

750

750

Point-spread function (FWHM)

[

pixels

]

1

1

1

1

1

1

1

1

1

Vacuum compatibility

Not applicable

Not applicable

Not applicable

Not applicable

Optional

Optional

Optional

Optional

Optional

Dimensions (W x H x D)

[

mm³

]

400 x 430 x 500

340 x 370 x 500

400 x 430 x 500

340 x 370 x 500

235 x 237 x 372

114 x 133 x 242

114 x 92 x 242

348 x 92 x 277

192 x 92 x 277

Weight

[

kg

]

55

41

55

41

15

4.7

3.7

9.7

5.8

Cooling method

Water (Module) / Air (Electronics)

Water (Module) / Air (Electronics)

Water (Module) / Air (Electronics)

Water (Module) / Air (Electronics)

Water (Module) / Air (Electronics)

Water (Module) / Air (Electronics)

Water (Module) / Air (Electronics)

Water (Module) / Air (Electronics)

Water (Module) / Air (Electronics)

PDF

Full specification

Full specification

Full specifications

Full specifications

Full specifications

Full specifications

Full specifications

Full specification

Full specification

1 One frame (16 bits) per exposure, i.e. single-threshold or difference image.
2 Effective dead time between exposures < 100 ns (max. loss of 1 count/pixel)

*All specifications are subject to change without notice.
 

Key Contact

Tilman Donath
Product Manager - High Energy

Case Study

In macromolecular crystallography (MX), the increase of X-ray energy beyond the conventional 10-15 keV range promises a lot of gains: it can improve the diffraction efficiency, delivering more and better data from fewer crystals. However, up until now, the only limiting factor was hardware. 

Using an EIGER2 cadmium-telluride detector for the first time, Selina L.S. Storm, Danny Axford, and Robin L. Owen from the Diamond Light Source (DLS) showcase the benefits of higher X-ray energies for macromolecular crystallography.

Publication: Experimental evidence for the benefits of higher X-ray energies for macromolecular crystallography, IUCr-J, September, 2021

Read the article

https://doi.org/10.1107/S2052252521008423

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To get more information for a tender or learn more about purchasing a DECTRIS EIGER2® X-ray detector for synchrotron beamlines , reach out to us.

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