DECTRIS at the 19 ème Colloque de la Société Française des Microscopies

We are honored to be part of the 19ème Colloque de la Société Française des Microscopies (Sfµ) in Toulouse, France, where researchers and professionals in the field will come together to share their discoveries, innovations, and technological advances.

Don't miss our talk

Exploring electron dose fractionation in TEM for material science applications using the latest generation of fast hybrid pixel detectors

Speaker: Dr. Jan Vávra

Date: Tuesday, July 1

Time: 5:36–5:48 PM

Session: Instrumental Advances

Hybrid pixel counting technology for electron detection

Speaker: Dr. Jan Vávra

Date: Thursday, July 3

Time: 2:15–2:25 PM

Session: Time-Resolved Techniques